VLSI - DFT Architect
Capgemini · Bengaluru · onsite · Posted 34d ago
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About this role
Roles & Responsibilities
We are seeking an experienced SoC Design-for-Test (DFT) Lead to drive DFT architecture, implementation, verification, and silicon bring-up activities for complex SoCs. The ideal candidate will possess strong expertise in scan compression, ATPG, JTAG/iJTAG, MBIST, and test integration methodologies, while leading cross-functional teams through the complete DFT lifecycle from architecture definition to production test support.
Key Responsibilities
Technical Leadership
We are seeking an experienced SoC Design-for-Test (DFT) Lead to drive DFT architecture, implementation, verification, and silicon bring-up activities for complex SoCs. The ideal candidate will possess strong expertise in scan compression, ATPG, JTAG/iJTAG, MBIST, and test integration methodologies, while leading cross-functional teams through the complete DFT lifecycle from architecture definition to production test support.
Key Responsibilities
Technical Leadership
- Lead DFT execution across multiple IPs and SoC programs.
- Mentor junior engineers and provide technical guidance on DFT best practices.
- Collaborate effectively with Design, Verification, Physical Design, Product Engineering, and Manufacturing teams.
- Participate in design reviews, architecture discussions, and project planning activities.
- Develop automation flows using Perl, Shell, TCL, or Python scripting.
- Collaborate with EDA vendors and internal methodology teams to improve productivity and test quality.
- Define and implement comprehensive DFT strategies for complex SoC designs.
- Architect and deploy Scan, ATPG, JTAG (IEEE 1149.x), IEEE 1500, IEEE 1687 (iJTAG), Scan Compression (EDT), MBIST, and advanced test infrastructures.
- Drive scan insertion and DFT implementation using Synopsys Fusion Compiler or equivalent industry-standard EDA tools.
- Develop and review DFT specifications, test architectures, and verification plans.
- Develop and validate STA constraints for various DFT modes.
- Generate high-quality ATPG patterns for stuck-at, transition, path delay, and bridge fault coverage.
- Perform ATPG coverage analysis, DRC closure, and optimization to achieve production test goals.
- Debug and resolve ATPG, scan chain, compression, and pattern-related issues.
- Validate ATPG patterns using simulation/debug environments.
- Investigate and root-cause silicon and tester failures, partnering closely with RTL, physical design, verification, and product engineering teams.
- Analyze compressed ATPG, MBIST, JTAG/IEEE1500, and iJTAG related failures.
- Support silicon bring-up, characterization, production ramp, and yield improvement activities.
- Drive test escape analysis and corrective action implementation.
- Excellent communication and stakeholder management skills.
- Strong problem-solving and analytical abilities.
- Proven ability to lead technical teams and drive execution across geographically distributed teams.
- Ability to influence architecture and methodology decisions across organizations.
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Skills
DRC closureSimulation debug environmentsAtpgMbisteda toolstclshellPerlJTAGSynopsys Fusion Compilerscan insertionIEEE1500ATPG coverage analysisIJTAGEDTscan compressionverification plansIEEE 1687Pythontest integrationSTA constraintsTest architecturesIEEE 1149.x
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Capgemini
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