Design-For-Test (DFT) Engineer

Project Role : Design-For-Test (DFT) Engineer
Project Role Description : Enable effective post-manufacturing chip testing by integrating testability features during the design phase. Apply DFT methodologies such as scan chains, Built-In Self-Test (BIST), and boundary scan to detect defects and enhance test coverage. Ensure high-quality silicon by collaborating with design and verification teams to optimize for test efficiency and fault isolation.
Must have skills : Design for Testability (DFT)
Good to have skills : NA
Minimum 3 year(s) of experience is required
Educational Qualification : 15 years full time education

Summary:
As a Design-For-Test Engineer, you will enable effective post-manufacturing chip testing by integrating testability features during the design phase. Your typical day will involve applying DFT methodologies such as scan chains, Built-In Self-Test, and boundary scan to detect defects and enhance test coverage. You will collaborate closely with design and verification teams to ensure high-quality silicon, optimizing for test efficiency and fault isolation, while continuously seeking innovative solutions to improve testing processes and outcomes.

Roles Responsibilities: -Tools proficiency Tessent, VCS, Verdi, DC, PT
-Tessent tool for ATPG setup, DRC analysis, pattern generation for Stuck-at, TDF, PDF
-Scan compression and insertion techniques
-ATPG Timing and no-timing simulation
JTAG/IJTAG
-Pattern delivery and coverage sign-off
- Expected to perform independently and become an SME.
- Required active participation/contribution in team discussions.
- Contribute in providing solutions to work related problems.
- Engage in continuous learning to stay updated with the latest DFT methodologies and technologies.
- Assist in the development of test plans and strategies to ensure comprehensive test coverage.

Professional Technical Skills: -Memory BIST and repair scheme implementation
-Logic BIST, JTAG/IJTAG, at-speed test, ATPG, fault simulation, back-annotated gate level verification, silicon debug, memory and scan diagnostics
-Familiarity with IEEE 1149, 1500, 1687, 1838
-Synthesis Static Timing Analysis
-Familiarity with SoC style architecture including multi-clock domain and low power design practices.
-Ability to work both collaboratively on a team and independently
-Hard-working and excellent time management skills with an ability to multi-task
-Validated understanding of Siemens or Synopsys DFT tools
-Extest, core-wrapping, IDDQ, Path Delay, Hold Time, RSQ, and SSD

- Must Have Skills: Proficiency in Design for Testability (DFT).
- Strong understanding of scan chain design and implementation.
- Experience with Built-In Self-Test (BIST) methodologies.
- Familiarity with boundary scan techniques and tools.
- Ability to analyze and interpret test results to identify areas for improvement
- The candidate should have minimum 3 years of experience in Design for Testability (DFT).
- This position is based at our Bengaluru office.
- A 15 years full time education is required.




Qualification
15 years full time education