Associate III - VLSI

Job Summary

Scan & ATPG - Strong understanding of Siemens Tessent Tools for ATPG with SSN methodology - Experience in ICL, PDL, Stuck-at and transition fault pattern generation - Good understanding on scan coverage and experience in carrying out coverage analysis.

Responsibilities

• Strong understanding of Siemens Tessent Tools for ATPG with SSN methodology
• Experience in ICL, PDL, Stuck-at and transition fault pattern generation
• Good understanding on scan coverage and experience in carrying out coverage analysis.
• Experience in Timing and no Timing gate level simulations and debugging simulation failures.
• Experience in carrying out DFT DRC checks in RTL and analyzing the violations.
• Strong understanding of Scan structures, IEEE1149.1, IEEE1687, ATPG methodology and flow.
• Good understanding of timing constraints, synthesis flow and scan insertion using DC/FC
• Strong TCL/scripting knowledge MBIST
• Strong understanding of Siemens Tessent tools for MBIST insertion and verification
• Experience in MBIST insertion in RTL, pattern generation.
• Experience in ICL, PDL, IEEE1149.1, IEEE1687, MBIST verification and debugging simulation failures.
• Good understanding of MBIST algorithms, architecture, and diagnosis features
• Strong TCL/scripting knowledge Verification
• Strong knowledge on ICL, PDL, IEEE1149.1, IEEE1687, Simulations tools such VCS
• Experience in creation of DFT test bench structures, verifying DFX structures in RTL and debugging simulation failures.
• Good understanding of DFT structures such as scan controller, OCC, EDT, JTAG, iJTAG, IOs, HSIO loopback, reset controller.
• Strong TCL/scripting knowledge

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